Susceptibility of microprocessors to transient faults

Today, embedded processors are nearly ubiquitous in technical products and provide a flexible and cost-efficient way to increase functionality. Because of the ongoing scaling in process technologies integrated circuits - and thus, embedded processors - become more and more susceptible to transient faults which impacts the reliability of the overall product.
In this thesis a particular microprocessor core (i8051, plasma, picoJava, hapra or LEON) shall be instrumented for fault injection and its susceptibility to transient faults investigated. This investigation must also take into account the characteristics of the diverse applications executed on the processor when the reliability of the whole system is considered.

Contact:
Prof. Dr. Hans-Joachim Wunderlich ( Email: wu@informatik.uni-stuttgart.de )
Michael Kochte ( Email: Michael.Kochte@iti.uni-stuttgart.de )